About this scholarly article

SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Waikoloa, HI (Thursday 22 August 2002)] Astronomical Data Analysis II - Multiscale geometric analysis for 3D catalogs by Donoho, David L.; Levi, Ofer; Starck, Jean-Luc; Martinez, Vicent; Starck, Jean-Luc; Murtagh, Fionn D. is a scholarly article available to read on EtoBox.

Author

Donoho, David L.; Levi, Ofer; Starck, Jean-Luc; Martinez, Vicent; Starck, Jean-Luc; Murtagh, Fionn D.

Publisher

SPIE

Published

2002

Language

EN