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About this Computer Science article
SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems by Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9340)
- Published
- 2018
- Language
- EN
- Field
- Computer Science (Physical Sciences)