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About this Physics and Astronomy article
Non-destructive Measurements on Recrystallization and Grain-size Characterization of Polycrystalline Silicon by Chil-Chyuan Kuo is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Chil-Chyuan Kuo
- Publisher
- Springer US; Springer-Verlag; Kluwer Academic/Plenum Publishers; Springer Science and Business Media LLC (ISSN 1573-8760)
- Published
- 2011
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)