About this scholarly article

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Liquid mirror as planarity standard: a simplified experimental approach by Vannoni, M.; Osten, Wolfgang; Gorecki, Christophe; Molesini, G.; Novak, Erik L. is a scholarly article available to read on EtoBox.

Author

Vannoni, M.; Osten, Wolfgang; Gorecki, Christophe; Molesini, G.; Novak, Erik L.

Publisher

SPIE

Published

2005