About this scholarly article

1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Rapid degradation of InGaAsP/InP laser diodes due to copper contamination by Fujihara, K.; Ishino, M.; Matsui, Y. is a scholarly article available to read on EtoBox.

Author

Fujihara, K.; Ishino, M.; Matsui, Y.

Publisher

IEEE

Published

1997

Language

EN