About this scholarly article

2017 IEEE International Symposium on Circuits and Systems (ISCAS) - A secure scan chain test scheme exploiting retention loss of memristors by Gong, Yanping; Qian, Fengyu; Wang, Lei is a scholarly article available to read on EtoBox.

Author

Gong, Yanping; Qian, Fengyu; Wang, Lei

Publisher

IEEE

Published

2017

Language

EN