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About this Materials Science article

X-ray Study of Small Dislocation Loops in Thermally Oxidized Silicon by Kawado, S. ;Maruyama, T. is a Materials Science article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Materials Science.

Author
Kawado, S. ;Maruyama, T.
Publisher
International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
Published
1972
Field
Materials Science (Physical Sciences)

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