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About this Engineering article
Electrical Characterization of Dielectrically Isolated Silicon Substrates Containing Buried Metallic Layers by Goh, W.L.; Montgomery, H.; Raza, S.H.; Armstrong, B.M.; Gamble, H.S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Goh, W.L.; Montgomery, H.; Raza, S.H.; Armstrong, B.M.; Gamble, H.S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 1997
- Field
- Engineering (Physical Sciences)
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