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About this Engineering article
Time-Dependent Reliability Of The Interface Between A-C:F And Inorganic Dielectrics by Endo, Kazuhiko; Shinoda, Keisuke; Tatsumi, Toni; Matsubara, Yoshihisa; Iguchi, Manabu; Horiuchi, Tadahiko is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Endo, Kazuhiko; Shinoda, Keisuke; Tatsumi, Toni; Matsubara, Yoshihisa; Iguchi, Manabu; Horiuchi, Tadahiko
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1998
- Language
- EN
- Field
- Engineering (Physical Sciences)