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About this Engineering article

Noninvasive Thickness Measurements of Metal Films Through Microwave Dielectric Resonators by Jung, Ho Sang; Lee, Jae Hun; Han, Hyun Kyung; Lee, Sang Young is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Jung, Ho Sang; Lee, Jae Hun; Han, Hyun Kyung; Lee, Sang Young
Publisher
The Korean Institute of Metals and Materials; Springer-Verlag; Korean Institute of Metals and Materials; Springer Science and Business Media LLC (ISSN 1738-8090)
Published
2016
Language
EN
Field
Engineering (Physical Sciences)