About this Engineering article
Transient Charge Decay in Lined Vessels and Silos by Jones, T.B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jones, T.B.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0093-9994)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)