About this scholarly article

2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Enhancing Performance in Thin Tilm Transistors with Vacuum or Solution Processed Amorphous Oxide Semiconductors Towards Display Applications by Chen, Changdong; Li, Gongtan; Li, MinMin; Yang, Bo-Ru; Liu, Chuan; Lee, Chia-Yu; Wu, Yuan-Chun; Lu, Po-Yen; Shieh, Han-Ping D. is a scholarly article available to read on EtoBox.

Author

Chen, Changdong; Li, Gongtan; Li, MinMin; Yang, Bo-Ru; Liu, Chuan; Lee, Chia-Yu; Wu, Yuan-Chun; Lu, Po-Yen; Shieh, Han-Ping D.

Publisher

IEEE

Published

2018