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About this Engineering article

Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers by Al-Hajjawi, Saed; Haunschild, Jonas; Zimmer, Martin; Dannenberg, Tobias; Preu, Ralf is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Al-Hajjawi, Saed; Haunschild, Jonas; Zimmer, Martin; Dannenberg, Tobias; Preu, Ralf
Publisher
Elsevier ; Elsevier BV (ISSN 1876-6102)
Published
2017
Language
EN
Field
Engineering (Physical Sciences)