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About this Engineering article
Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers by Al-Hajjawi, Saed; Haunschild, Jonas; Zimmer, Martin; Dannenberg, Tobias; Preu, Ralf is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Al-Hajjawi, Saed; Haunschild, Jonas; Zimmer, Martin; Dannenberg, Tobias; Preu, Ralf
- Publisher
- Elsevier ; Elsevier BV (ISSN 1876-6102)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)