Can I read Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS on EtoBox?

Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS by M. P. Seah; G. C. Smith is a Engineering article available to read on EtoBox.

What is Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS about?

## Abstract For the use of published general or theoretical sensitivity factors in quantitative AES and XPS, the energy dependence of both the spectrometer transmission function and the detector sensitivity must be known. Here, we develop simple procedures that allow these dependencies to be determined experimentally. Detailed measurements for a modified VG Scientific ESCALAB II, the __metrology spectrometer__, operated in both the constant Δ__E__/__E__ and constant Δ__E__ modes, are presented and compared with theoretical estimates. It is shown that an exceptionally detailed electron‐optical calculation, involving proprietary information, would be required to match the accuracy of the experimental procedures developed. Removal of the spectrometer transmission function and the detector sensitivity terms allow the measured spectrum to be converted to the true electron emission spectrum, irrespective of the mode of operation. This provides the first step to the provision of reference samples to calibrate the transmission functions and detector sensitivities of all instruments so that they, in turn, may produce true electron emission spectra. This is vital if: (1) all instruments are

Who reads Quantitative AES and XPS: Determination of the electron spectrometer transmission function and the detector sensitivity energy dependencies for the production of true electron emission spectra in AES and XPS?

Author

M. P. Seah; G. C. Smith

Publisher

John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley; Research Square (ISSN 0142-2421)

Published

1990

Language

EN

Field

Engineering (Physical Sciences)