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About this Physics and Astronomy article
Effect of Annealing Time on Bias Stress and Light-induced Instabilities in Amorphous Indium–gallium–zinc-oxide Thin-film Transistors by M. D. H. Chowdhury; S. H. Ryu; P. Migliorato; J. Jang is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- M. D. H. Chowdhury; S. H. Ryu; P. Migliorato; J. Jang
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 2011
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)
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