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SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, USA (Monday 5 May 2014)] Micro- and Nanotechnology Sensors, Systems, and Applications VI - Imaging quality comparison of two typical methods for imaging through turbid media by George, Thomas; Islam, M. Saif; Dutta, Achyut K.; Shao, Xiaopeng; Wu, Tengfei; Gong, Changmei is a scholarly article available to read on EtoBox.

Author
George, Thomas; Islam, M. Saif; Dutta, Achyut K.; Shao, Xiaopeng; Wu, Tengfei; Gong, Changmei
Publisher
SPIE
Published
2014

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