About this Engineering article
Impact ionization and Auger recombination at high carrier temperature by Yasuhiko Takeda; Tadashi Ito; Ryo Suzuki; Tomoyoshi Motohiro; Santosh Shrestha; Gavin Conibeer is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yasuhiko Takeda; Tadashi Ito; Ryo Suzuki; Tomoyoshi Motohiro; Santosh Shrestha; Gavin Conibeer
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0927-0248)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)