About this scholarly article

The 40th International Conference on Computers & Indutrial Engineering - Economic statistical design of x-bar control charts for correlated data and Gamma failure mechanism with genetic algorithm by Chen, Fei Long; Yeh, Li Lun is a scholarly article available to read on EtoBox.

Author

Chen, Fei Long; Yeh, Li Lun

Publisher

IEEE

Published

2010

Language

EN