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Comparison of the Structure of Polyelectrolyte Multilayer Films Exhibiting a Linear and an Exponential Growth Regime: An in Situ Atomic Force Microscopy Study by Ph. Lavalle; C. Gergely; F. J. G. Cuisinier; G. Decher; P. Schaaf; J. C. Voegel; C. Picart is a Materials Science article available to read on EtoBox.
What is Comparison of the Structure of Polyelectrolyte Multilayer Films Exhibiting a Linear and an Exponential Growth Regime: An in Situ Atomic Force Microscopy Study about?
We report here on the structural characterization of polyelectrolytes multilayer films formed by poly(L-glutamic acid) and poly(L-lysine) (PGA/PLL). The growth of this system is compared to that of poly(styrenesulfonate)/poly(allylamine hydrochloride) (PSS/PAH) multilayers by means of in situ atomic force microscopy (AFM) and by optical waveguide lightmode spectroscopy (OWLS). In contrary to the (PSS/PAH)i films that are growing linearly with the number of deposited layer pairs i, optical data evidenced that the (PGA/PLL)i films are characterized by an exponential growth. The analysis of the structure of the (PSS/PAH)i films reveals a smooth featureless surface covered by small globules. On the other hand, (PGA/PLL)i films form extended structures that appear with a vermiculate pattern. We propose a new growth mechanism based on polyelectrolyte diffusion in and out of the film coupled to the formation of polyanion/polycation complexes at the surface of the film in order to explain the whole results.
Who reads Comparison of the Structure of Polyelectrolyte Multilayer Films Exhibiting a Linear and an Exponential Growth Regime: An in Situ Atomic Force Microscopy Study?
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Ph. Lavalle; C. Gergely; F. J. G. Cuisinier; G. Decher; P. Schaaf; J. C. Voegel; C. Picart
- Publisher
- American Chemical Society (ACS)
- Published
- 2002
- Language
- EN
- Field
- Materials Science (Physical Sciences)