About this scholarly article

9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. - An improved source design for scan BIST by Chaowen Yu, ; Wei LI, ; Reddy, S.M.; Pomeranz, I. is a scholarly article available to read on EtoBox.

Author

Chaowen Yu, ; Wei LI, ; Reddy, S.M.; Pomeranz, I.

Publisher

IEEE Comput. Soc

Published

2003

Language

EN