About this Materials Science article
Impact of rapid thermal annealing on Mg-implanted GaN with a SiO x /AlN cap-layer by Khalfaoui, Wahid; Oheix, Thomas; El-Zammar, Georgio; Benoit, Roland; Cayrel, Frederic; Faulques, Eric; Massuyeau, Florian; Yvon, Arnaud; Collard, Emmanuel; Alquier, Daniel is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Khalfaoui, Wahid; Oheix, Thomas; El-Zammar, Georgio; Benoit, Roland; Cayrel, Frederic; Faulques, Eric; Massuyeau, Florian; Yvon, Arnaud; Collard, Emmanuel; Alquier, Daniel
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Ltd.; Wiley; Wiley - V C H Verlag GmbbH & Co. (ISSN 0031-8965)
- Published
- 2016
- Language
- EN
- Field
- Materials Science (Physical Sciences)