About this Materials Science article
Beam damage of HS(CH2)15 COOH Terminated Self Assembled Monolayer (SAM) as Observed by X-ray Photoelectron Spectroscopy by Engelhard, Mark; Tarasevich, Barb; Baer, Don is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Engelhard, Mark; Tarasevich, Barb; Baer, Don
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics Inc. (ISSN 1055-5269)
- Published
- 2011
- Language
- EN
- Field
- Materials Science (Physical Sciences)