Opening book details…
About this Engineering article
Understanding the structure of Si nanoclusters in a/nc-Si:H films using spherical aberration-corrected transmission electron microscopy by Perrey, Christopher R.; Thompson, Siri S.; Lentzen, Markus; Kortshagen, Uwe; Carter, C. Barry is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Perrey, Christopher R.; Thompson, Siri S.; Lentzen, Markus; Kortshagen, Uwe; Carter, C. Barry
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2004
- Field
- Engineering (Physical Sciences)