About this scholarly article

2006 IEEE international SOI Conferencee Proceedings - Post-RTA Effect on Electrical Characteristics of Nano-scale Strained Si Grown on SiGe-on-Insulator n-MOSFET by Park, Jea-gun; Shim, Tae-hun; Lee, Gon-sub; Cho, Won-ju; Ahn, Chang-geun is a scholarly article available to read on EtoBox.

Author

Park, Jea-gun; Shim, Tae-hun; Lee, Gon-sub; Cho, Won-ju; Ahn, Chang-geun

Publisher

IEEE

Published

2006

Language

EN