About this scholarly article

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Investigation and Improvement of Fast Temperature-Cycle Reliability for DMOS-Related Conductor Path Design by Smorodin, Tobias; Wilde, Jurgen; Alpern, Peter; Stecher, Matthias is a scholarly article available to read on EtoBox.

Author

Smorodin, Tobias; Wilde, Jurgen; Alpern, Peter; Stecher, Matthias

Publisher

IEEE

Published

2007