About this scholarly article

1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116) - Verification of hole scattering rates in Si with quantum yield experiment by Kamakura, Y.; Taniguchi, K. is a scholarly article available to read on EtoBox.

Author

Kamakura, Y.; Taniguchi, K.

Publisher

IEEE

Published

1998