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2008 IEEE International Conference on Vehicular Electronics and Safety - Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop by Yingping Huang, ; Mouzakitis, Alexandros; McMurran, Ross; Dhadyalla, Gunwant; Jones, R. Peter is a scholarly article available to read on EtoBox.

Author
Yingping Huang, ; Mouzakitis, Alexandros; McMurran, Ross; Dhadyalla, Gunwant; Jones, R. Peter
Publisher
IEEE
Published
2008
Language
EN

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