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Measuring the Impact Ionization and Charge Trapping Probabilities in SuperCDMS HVeV Phonon Sensing Detectors by Ponce, F.; Page, W.; Brink, P. L.; Cabrera, B.; Cherry, M.; Fink, C.; Kurinsky, N.; Partridge, R.; Pyle, M.; Sadoulet, B.; Serfass, B.; Stanford, C.; Watkins, S. L.; Yellin, S.; Young, B. A. is a scholarly article available to read on EtoBox.

What is Measuring the Impact Ionization and Charge Trapping Probabilities in SuperCDMS HVeV Phonon Sensing Detectors about?

A 0.93 gram $1{\times}1{\times}0.4$ cm$^3$ SuperCDMS silicon HVeV detector operated at 30 mK was illuminated by 1.91 eV photons using a room temperature pulsed laser coupled to the cryostat via fiber optic. The detector's response under a variety of specific operating conditions was used to study the detector leakage current, charge trapping and impact ionization in the high-purity Si substrate. The measured probabilities for a charge carrier in the detector to undergo charge trapping (0.713 $\pm$ 0.093%) or cause impact ionization (1.576 $\pm$ 0.110%) were found to be nearly independent of bias polarity and charge-carrier type (electron or hole) for substrate biases of $\pm$ 140 V.

Author

Ponce, F.; Page, W.; Brink, P. L.; Cabrera, B.; Cherry, M.; Fink, C.; Kurinsky, N.; Partridge, R.; Pyle, M.; Sadoulet, B.; Serfass, B.; Stanford, C.; Watkins, S. L.; Yellin, S.; Young, B. A.

Published

2019

Language

EN