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About this Materials Science article
On the relation between damage rate and stress level evolution in α-Cr2O3 thin films growing on Ni–33at%Cr by R. Siab; C. Huvier; M. Kemdehoundja; J.L. Grosseau-Poussard; J.F. Dinhut is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- R. Siab; C. Huvier; M. Kemdehoundja; J.L. Grosseau-Poussard; J.F. Dinhut
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0010-938X)
- Published
- 2009
- Field
- Materials Science (Physical Sciences)
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