About this scholarly article

SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - San Diego, California, USA (Sunday 6 March 2011)] Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2011 - Wavelet aided multivariate outlier analysis to enhance defect contrast in thermal images by Manohar, Arun; Tomizuka, Masayoshi; Lanza di Scalea, Francesco is a scholarly article available to read on EtoBox.

Author

Manohar, Arun; Tomizuka, Masayoshi; Lanza di Scalea, Francesco

Publisher

SPIE

Published

2011

Language

EN