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About this Engineering article
Microscopic scale characterization and modeling of transistor degradation under HC stress by Yoann Mamy Randriamihaja; V. Huard; X. Federspiel; A. Zaka; P. Palestri; D. Rideau; D. Roy; A. Bravaix is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yoann Mamy Randriamihaja; V. Huard; X. Federspiel; A. Zaka; P. Palestri; D. Rideau; D. Roy; A. Bravaix
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2012
- Field
- Engineering (Physical Sciences)