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About this Engineering article
Studying the fine microstructure of the passive film on nanocrystalline 304 stainless steel by EIS, XPS, and AFM by Zheng, Z. J.; Gao, Y.; Gui, Y.; Zhu, M. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zheng, Z. J.; Gao, Y.; Gui, Y.; Zhu, M.
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 1432-8488)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)