About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Reflection, Scattering, and Diffraction from Surfaces IV - Dynamic data driven bidirectional reflectance distribution function measurement system by Hanssen, Leonard M.; Nauyoks, Stephen E.; Freda, Sam; Marciniak, Michael A. is a scholarly article available to read on EtoBox.

Author

Hanssen, Leonard M.; Nauyoks, Stephen E.; Freda, Sam; Marciniak, Michael A.

Publisher

SPIE

Published

2014