Opening book details…
Can I read Investigation of diode geometry and metal line pattern for robust ESD protection applications on EtoBox?
Investigation of diode geometry and metal line pattern for robust ESD protection applications by You Li; Juin J. Liou; Jim Vinson is a Engineering article available to read on EtoBox.
What is Investigation of diode geometry and metal line pattern for robust ESD protection applications about?
The effect of different diode geometries and metal patterns on the failure current It2 is investigated experimentally. The devices considered are N+/P well LOCOS diodes having different lengths, widths, finger numbers, and metal connections. The results provide useful insights into optimizing the diode for robust electrostatic discharge (ESD) protection applications.
Who reads Investigation of diode geometry and metal line pattern for robust ESD protection applications?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- You Li; Juin J. Liou; Jim Vinson
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)