About this scholarly article

2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level by Salmani, Hassan; Tehranipoor, Mohammed is a scholarly article available to read on EtoBox.

Author

Salmani, Hassan; Tehranipoor, Mohammed

Publisher

IEEE

Published

2013