About this scholarly article

2017 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Development of a scanning tunneling microscope for the carrier profiling of semiconductors by scanning frequency comb microscopy by Spencer, Greg; Hagmann, Mark J. is a scholarly article available to read on EtoBox.

Author

Spencer, Greg; Hagmann, Mark J.

Publisher

IEEE

Published

2017

Language

EN