Opening book details…
About this scholarly article
IEEE International Integrated Reliability Workshop Final Report, 2003 - A current mirror method for thermal instability of SOI BJT by Kim, J.; Liu, Y.; De Santis, J.A. is a scholarly article available to read on EtoBox.
- Author
- Kim, J.; Liu, Y.; De Santis, J.A.
- Publisher
- IEEE
- Published
- 2003
- Language
- EN