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What is Nova VeraFlex III+ X-Ray Metrology Launch about?

Nova, a leading provider of metrology solutions for semiconductor manufacturing, has launched the VeraFlex III+, the fifth generation of its X-ray metrology solution. The VeraFlex III+ provides enhanced metrology performance, improved productivity and precision for composition and thin film thickness measurement. It will extend the use of X-ray technology for in-line process control at advanced logic and memory nodes. Nova has experienced tremendous growth driven by increased adoption from major customers d

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Anonymous pcUavVJr

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