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About this Engineering article
Lateral Ion Implant Straggle and Mask Proximity Effect by Hook, T.B.; Brown, J.; Cottrell, P.; Adler, E.; Hoyniak, D.; Johnson, J.; Mann, R. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hook, T.B.; Brown, J.; Cottrell, P.; Adler, E.; Hoyniak, D.; Johnson, J.; Mann, R.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2003
- Field
- Engineering (Physical Sciences)