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About this Engineering article
Profiling the Rough Surface by Migration by Xuan Feng; Sato, M.; Cai Liu; Yan Zhang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Xuan Feng; Sato, M.; Cai Liu; Yan Zhang
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1545-598X)
- Published
- 2009
- Language
- EN
- Field
- Engineering (Physical Sciences)