About this scholarly article

Advances in Electronic Packaging, Parts A, B, and C - Stress Concentration and Surface Roughness Effect on Strength of Polycrystalline Silicon Structure by Hamada, Shigeru; Tani, Shuichi; Katagiri, Daisuke; Tsugai, Masahiro; Horikawa, Makio; Otani, Hiroshi is a scholarly article available to read on EtoBox.

Author

Hamada, Shigeru; Tani, Shuichi; Katagiri, Daisuke; Tsugai, Masahiro; Horikawa, Makio; Otani, Hiroshi

Publisher

ASMEDC

Published

2005