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Applications of Scanned Probe Microscopy to Polymers (ACS Symposium Series, No. 897) by James D. Batteas; Chris A. Michaels; Gilbert C. Walker; Andre J. Gesquiere; Doo Young Kim; So-Jung Park; Paul F. Barbara; Joseph M. Imhof; Eun-Soo Kwak; David A. Vanden Bout; Jeffrey E. Hall; Daniel A. Higgins; D. Bruce Chase; Stephan J. Stranick; Boris B. Akhremitchev; Larissa Stebounova; Yujie Sun; Lori S. Goldner; Michael J. Fasolka; Scott N. Goldie; Ph. Leclère; V. Cornet; M. Surin; P. Viville; J. P. Aimé; R. Lazzaroni; Scott Sills; Tomoko Gray; Jane Frommer; René M. Overney; Aric Opdahl; Gabor A. Somorjai; H. Shulha; Y.-H. Lin; V. V. Tsukruk; Pamela Y. Meadows; Jason E. Bemis; Sabah Al-Maawali; Richard Law; Nishant Bhasin; Dennis Discher; Efrosini Kokkoli; Anastasia Mardilovich; Jamie K. Hobbs; Andrew D. L. Humphris; Mervyn J. Miles; Sergiy Minko; Anton Kiriy; Ganna Gorodyska; Roman Sheparovych; Robert Lupitskyy; Constantinos Tsitsilianis; Manfred Stamm; Francis M. Mirabella; Keiji Tanaka; Atsushi Takahara; Tisato Kajiyama is a book available to read on EtoBox.
What is Applications of Scanned Probe Microscopy to Polymers (ACS Symposium Series, No. 897) about?
<p>scanning Probe Microscopy Is Capable Of Revealing Nanoscale Surface Structures And Mechanical Properties Of Single Molecules In Natural Polymers (such As Proteins) And Synthetic Polymers. The Editors (of The National Institute Of Standards And Technology And The U. Of Pittsburgh) Present Examples Of The Applications Of The Technology In 17 Papers Discussing Near-field Scanning Optical Microscopy, Mechanical Studies Of Polymers By Atomic Force Microscopy, Single- Molecule Studies, And Polymer Surface Characterization By Scanned Probes. Specific Examples Include Chemical Imaging Of Heterogeneous Polymeric Material With Near-field Infrared Microscopy, Investigation Of Nanorheological Properties Of Mesoscopic Polymer Systems, Multilayered Nanoscale Systems And Atomic Force Microscopy Mechanical Measurements, And Evaluation Of Surface Composition In Miscible Polymer Blends By Lateral Force Microscopy. Distributed In The Us By Oxford U. Press. Annotation ©2004 Book News, Inc., Portland, Or</p>
- Author
- James D. Batteas; Chris A. Michaels; Gilbert C. Walker; Andre J. Gesquiere; Doo Young Kim; So-Jung Park; Paul F. Barbara; Joseph M. Imhof; Eun-Soo Kwak; David A. Vanden Bout; Jeffrey E. Hall; Daniel A. Higgins; D. Bruce Chase; Stephan J. Stranick; Boris B. Akhremitchev; Larissa Stebounova; Yujie Sun; Lori S. Goldner; Michael J. Fasolka; Scott N. Goldie; Ph. Leclère; V. Cornet; M. Surin; P. Viville; J. P. Aimé; R. Lazzaroni; Scott Sills; Tomoko Gray; Jane Frommer; René M. Overney; Aric Opdahl; Gabor A. Somorjai; H. Shulha; Y.-H. Lin; V. V. Tsukruk; Pamela Y. Meadows; Jason E. Bemis; Sabah Al-Maawali; Richard Law; Nishant Bhasin; Dennis Discher; Efrosini Kokkoli; Anastasia Mardilovich; Jamie K. Hobbs; Andrew D. L. Humphris; Mervyn J. Miles; Sergiy Minko; Anton Kiriy; Ganna Gorodyska; Roman Sheparovych; Robert Lupitskyy; Constantinos Tsitsilianis; Manfred Stamm; Francis M. Mirabella; Keiji Tanaka; Atsushi Takahara; Tisato Kajiyama
- Publisher
- An American Chemical Society Publication
- Published
- 2005
- Language
- EN
- ISBN
- 9780841238831
- Subjects
- Science, Technology, Chemistry
More by James D. Batteas; Chris A. Michaels; Gilbert C. Walker; Andre J. Gesquiere; Doo Young Kim; So-Jung Park; Paul F. Barbara; Joseph M. Imhof; Eun-Soo Kwak; David A. Vanden Bout; Jeffrey E. Hall; Daniel A. Higgins; D. Bruce Chase; Stephan J. Stranick; Boris B. Akhremitchev; Larissa Stebounova; Yujie Sun; Lori S. Goldner; Michael J. Fasolka; Scott N. Goldie; Ph. Leclère; V. Cornet; M. Surin; P. Viville; J. P. Aimé; R. Lazzaroni; Scott Sills; Tomoko Gray; Jane Frommer; René M. Overney; Aric Opdahl; Gabor A. Somorjai; H. Shulha; Y.-H. Lin; V. V. Tsukruk; Pamela Y. Meadows; Jason E. Bemis; Sabah Al-Maawali; Richard Law; Nishant Bhasin; Dennis Discher; Efrosini Kokkoli; Anastasia Mardilovich; Jamie K. Hobbs; Andrew D. L. Humphris; Mervyn J. Miles; Sergiy Minko; Anton Kiriy; Ganna Gorodyska; Roman Sheparovych; Robert Lupitskyy; Constantinos Tsitsilianis; Manfred Stamm; Francis M. Mirabella; Keiji Tanaka; Atsushi Takahara; Tisato Kajiyama
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