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About this Engineering article
Reflectometry Based on a Frequency-shifted Interferometer Using Sideband Interference by Qi, Bing; Ye, Fei; Qian, Li; Lo, Hoi-Kwong is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Qi, Bing; Ye, Fei; Qian, Li; Lo, Hoi-Kwong
- Publisher
- Optical Society of America; The Optical Society (ISSN 0146-9592)
- Published
- 2013
- Field
- Engineering (Physical Sciences)
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