About this scholarly article

SPIE Proceedings [SPIE Astronomical Telescopes and Instrumentation - Glasgow, Scotland (Monday 21 June 2004)] Optical Fabrication, Metrology, and Material Advancements for Telescopes - The SiC technology is ready for the next generation of extremely large telescopes by Bougoin, Michel; Deny, Pierre; Atad-Ettedgui, Eli; Dierickx, Philippe is a scholarly article available to read on EtoBox.

Author

Bougoin, Michel; Deny, Pierre; Atad-Ettedgui, Eli; Dierickx, Philippe

Publisher

SPIE

Published

2004