About this scholarly article

SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Image Quality and System Performance - Louis Leon Thurstone in Monte Carlo: creating error bars for the method of paired comparison by Montag, Ethan D.; Miyake, Yoichi; Rasmussen, D. Rene is a scholarly article available to read on EtoBox.

Author

Montag, Ethan D.; Miyake, Yoichi; Rasmussen, D. Rene

Publisher

SPIE

Published

2003

Language

EN