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Effects of the cap layer on the properties of AlN barrier HEMT grown on 6-inch Si(111) substrate by Xia, Yuanyang; Zhu, Youhua; Liu, Chunhua; Wei, Hongyuan; Zhang, Tingting; Lee, Yeeheng; Zhu, Tinggang; wang, Meiyu; Yi, Li; Ge, Mei is a Materials Science article available to read on EtoBox.

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Author
Xia, Yuanyang; Zhu, Youhua; Liu, Chunhua; Wei, Hongyuan; Zhang, Tingting; Lee, Yeeheng; Zhu, Tinggang; wang, Meiyu; Yi, Li; Ge, Mei
Publisher
IOP Publishing; IOP Publishing Ltd. (ISSN 2053-1591)
Published
2020
Field
Materials Science (Physical Sciences)

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