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About this Materials Science article
Effects of the cap layer on the properties of AlN barrier HEMT grown on 6-inch Si(111) substrate by Xia, Yuanyang; Zhu, Youhua; Liu, Chunhua; Wei, Hongyuan; Zhang, Tingting; Lee, Yeeheng; Zhu, Tinggang; wang, Meiyu; Yi, Li; Ge, Mei is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Xia, Yuanyang; Zhu, Youhua; Liu, Chunhua; Wei, Hongyuan; Zhang, Tingting; Lee, Yeeheng; Zhu, Tinggang; wang, Meiyu; Yi, Li; Ge, Mei
- Publisher
- IOP Publishing; IOP Publishing Ltd. (ISSN 2053-1591)
- Published
- 2020
- Field
- Materials Science (Physical Sciences)