About this scholarly article

Reliability of Metal Interconnect After a High-current Pulse by Scarpulla, J.; Eng, D.C.; Brown, S.; MacWilliams, P. is a scholarly article available to read on EtoBox.

Author

Scarpulla, J.; Eng, D.C.; Brown, S.; MacWilliams, P.

Publisher

IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)

Published

1996

Language

EN