About this scholarly article

SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Practical Holography XXV: Materials and Applications - Quantitative quality measure based on light wave distribution to access 3D display by Sakamoto, Yuji; Bjelkhagen, Hans I.; Okuyama, Fumio is a scholarly article available to read on EtoBox.

Author

Sakamoto, Yuji; Bjelkhagen, Hans I.; Okuyama, Fumio

Publisher

SPIE

Published

2011

Language

EN