About this scholarly article

2013 IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops - Empirically Identifying the Best Greedy Algorithm for Covering Array Generation by Nie, Changhai; Jiang, Jing; Wu, Huayao; Leung, Hareton; Colbourn, Charles J. is a scholarly article available to read on EtoBox.

Author

Nie, Changhai; Jiang, Jing; Wu, Huayao; Leung, Hareton; Colbourn, Charles J.

Publisher

IEEE

Published

2013