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About this Engineering article
Research of a test sequence to detect defects in sequential logic circuits: é and ié. Onde Elec.52, No. 3, March (1972), p. 140. (In French.) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 1972
- Field
- Engineering (Physical Sciences)